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11 Beam scanning laser interferometer with high spatial resolution over a large field of view / Sasaki, Osami,Saito, Tsuyoshi,Choi, Samuel,Suzuki, Takamasa -- International Society for Optical Engineering, SPIENov-2011 Proceedings of SPIE - the International Society for Optical Engineering Vol.8201 p.82010J-1-82010J-7
12 Profile measurement of thin films by linear wavenumber-scanning interferometry / Sasaki, Osami,Hirakubo, Satoshi,Choi, Samuel,Suzuki, Takamasa -- International Society for Optical Engineering, SPIESep-2011 Proceedings of SPIE - the International Society for Optical Engineering Vol.8133 p.81330K-1-81330K-8
13 Sinusoidal wavelength-scanning common-path interferometer with a beam-scanning system for measurement of film thickness variations / Sasaki, Osami,Morimatsu, Takafumi,Choi, Samuel,Suzuki, Takamasa -- International Society for Optical Engineering, SPIENov-2010 Proceedings of SPIE - the International Society for Optical Engineering Vol.7855 p.78550S-1-78550S-6
14 Multiple-wavelength interferometers using backpropagation of optical fields for profile measurement of thin glass sheets / Sasaki, Osami,Samuel, Choi,Suzuki, Takamasa -- International Society for Optical Engineering, SPIEAug-2010 Proceedings of SPIE - the International Society for Optical Engineering Vol.7790 p.77900U-1-77900U-7
15 Measurement of thin film shape with a sinusoidal wavelength scanning interferometer using a white light source / Sasaki, Osami,Ueno, Hiroshi,Suzuki, Takamasa -- International Society for Optical Engineering, SPIENov-2009 Proceedings of SPIE - the International Society for Optical Engineering Vol.7511 p.75110B-1-75110B-7
16 A tunable external cavity laser diode with no mechanical movement / Suzuki, Takamasa,Nagai, Ryuichi,Sasaki, Osami -- International Society for Optical Engineering, SPIENov-2009 Proceedings of SPIE - the International Society for Optical Engineering Vol.7511 p.75110O-1-75110O-9
17 Inner surface profile measurement of a hydrodynamic bearing by an oblique incidence and two-wavelength interferometer / Sasaki, Osami,Yamamura, Ryota,Yokoyama, Kazushi,Suzuki, Takamasa -- International Society for Optical Engineering, SPIEAug-2009 Proceedings of SPIE - the International Society for Optical Engineering Vol.7432 p.74320J-1-74320J-5
18 Interference fringe analysis using wavelet transform / Suzuki, Takamasa,Kiyohara, Ryo,Ichikawa, Mika,Sasaki, Osami -- International Society for Optical Engineering, SPIENov-2008 Proceedings of SPIE - the International Society for Optical Engineering Vol.7160 p.716002-1-716002-12
19 Phase-shifting laser diode Sagnac interferometer for surface profile measurement / Suzuki, Takamasa,Shirai, Masato,Sasaki, Osami -- International Society for Optical Engineering, SPIENov-2007 Proceedings of SPIE - the International Society for Optical Engineering Vol.6829 p.68290A-1-68290A-8
20 Multiple-period fringe projection interferometry using a back-propagation method for surface measurement of glass plate / Huan, Hai,Sasaki, Osami,Suzuki, Takamasa -- International Society for Optical Engineering, SPIENov-2007 Proceedings of SPIE - the International Society for Optical Engineering Vol.6829 p.68290C-1-68290C-7

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